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Vertically polarized scattered light has different scattering patterns and fine structures from that of horizontally polarized light for small particles. The main characteristic of the horizontal scattering intensity (Ih) for small particles is that there is a minimum around 90 degrees. This minimum shifts to larger angles for larger particles. Thus, although both vertical scattering intensity (Iv) and (Ih) have only small contrast in the case of small particles, the difference between them can reveal a more distinguished fine structure, thereby making the sizing of small particles possible. Combining polarization effects with wavelength dependence at large angles, we can extend the lower sizing limit to as low as 10 nm, almost reaching the theoretical limit. This combined approach is known as the Polarization Intensity Differential Scattering (PIDS) technique patented by Beckman Coulter.
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